銦（In）

規格：

      高純銦：99.999% In-5N-I-24

      檢測雜質：Cu, Fe, Mg, Ni, Pb, Sn, Tl, Zn, Si, S

      雜質總含量：≤10ppm

      高純銦：99.9999% In-6N-I-25

      檢測雜質：Cd, Cu, Fe, Mg, Pb, S, Si, Sn

      雜質總含量：≤1ppm

      高純銦：99.99999% In-7N-I-26

      檢測雜質：Ag, Cd, Cu, Fe, Mg, Ni, Pb, Zn

     雜質總含量：≤0.1ppm

用途：主要用于制備Ⅲ-Ⅴ族化合物半導體、高純合金以及ITO粉末。

包裝：滌綸薄膜包裝后雙層復合膜抽真空包裝外套復合鋁箔內充氬氣封裝或直接玻璃管真空封裝。

Specification:
High purity In: 99.999% In-5N-I-24
Testing impurity: Cu, Fe, Mg, Ni, Pb, Sn, Tl, Zn, Si, S
Total impurity content: ≤10ppm
High purity In: 99.9999% In-6N-I-25
Testing impurity: Cd, Cu, Fe, Mg, Pb, S, Si, Sn
Total impurity content: ≤1ppm
High purity In: 99.99999% In-7N-I-26
Testing impurity: Ag, Cd, Cu, Fe, Mg, Ni, Pb, Zn
Total impurity content: ≤0.1ppm
Application: Used for preparation Ⅲ-Ⅴ elements chemical compound semiconductor, high purity metal, and ITO powder.
Package: Packed with terylene film, and double poly-film with vacuum encapsulation, then with aluminum foil with argon encapsulation. Packed with glass tube with vacuum encapsulation directly.